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Inspire XP-160 Burn In SYstems


Inspire XP-160 Burn-in System

The Inspire Burn-in System is mainly used for testing digital IC's. Every slot provides 96+ drive, 64 monitor channels, and 4 power supplies. This system supports Incal 160 style BIB. The standard oven is a 56 slot system, but other options as well as Prescreen Stations are available.

BIB Format

  • 12.32"W x 23.85"L x 62mil thick
  • 50mil spacing, 212 pin edge finger for signaling (drive/monitor)
  • 156mil edge fingers for power supplies (60A current)
  • 96 drive & 64 monitoring channels
  • 16-bit BIB ID
  • Supports iSocket requirements

Inspire Application

  • Runs natively on Windows XP and Windows 7
  • Application controls/ monitors all aspect of Burn-in
  • Recipe/Pattern Editors
  • Built-in Logger for system events, temperature and lots
  • Programmable logging interval
  • GUI logic analyzer
  • Color-coded fail monitoring

4:1 Architecture

  • One Driver for 4 BIB
  • Only 14 drivers for 56 slot system
  • Reduces system cost
  • INCAL SST Backplanes
  • Pass Marker allows driver to sample on one BIB for entire pattern length for effective monitoring

Power Sources

  • Up to 16 Power Supplies controlled and Monitored
  • Many zoning schemes available
  • Positive or negative voltage
  • Sequencing and delays
  • Under/Over Voltage shutdown
  • Many power supplies to choose
  • GPIB or LXI
  • Slot current monitoring

160 Drive and Monitor

  • Reliable Burn-in driver
  • 25Mhz with 16Meg depth
  • VOH: 0.5V to 5.5V
  • Drive shorts monitoring
  • 4-point Clock Skew/ RZ formatting on all channels
  • Four types of monitoring available on all channels
  • Opt Module: 16 analog channels

System Configuration: Chambers

  • HTOL (56 slot, 75ºC to 155ºC)
  • LTOL (POTC) (24 slot, -55ºC to 155ºC)
  • Dual Stack (8 Slot (x2), 75ºC to 155ºC) Multi Chamber

Prescreen Bench Options

  • Full Bench w/Fixture
  • Compact Cube w/Fixture
Incal Inspire XP-160 Burn-in System Datasheet

Inspire XP160 Burn-in System Datasheet
(pdf. 527 KB)