Xp8160 Burn In SYstems
The Inspire Burn-in System is mainly used for testing SOC & mixed signal IC's. Every slot provides 144I/O (96+ drive, and up to 52 monitor channels), and 8 power supplies. This system supports Incal's 8160 style BIB. The standard oven is a DS 2x 8 slot system, though other options as well as Prescreen Stations are available.
BIB Format
- 12.32"W x 23.85"L x 62mil thick
- BIB power supplies up to 8 (98A current) 2x @ 25A, 6x @ 8A ea
- 144 I/O per BIB (96+ drive and up to 52 monitoring channels)
- Supports Thermal Socket interface requirement
Inspire Application
- Runs natively on Windows XP and Windows 7.
- Application controls/ monitors all aspect of Burn-in
- Recipe/Pattern Editors
- Built-in Logger for system events, temperature and lots
- Programmable logging interval
- GUI logic analyzer
- Color-coded fail monitoring
8 Power Source
- Up to 32 Power Supplies controlled and monitored
- Positive or negative voltage
- Sequencing and delays
- Under/Over Voltage shutdown
- Many power supplies to choose from GPIB or LXI interface standard
- Slot current monitoring
4:1 Architecture
- One Driver for 4 BIB
- Only 4 drivers for 2x 8 slot system
- Reduces system cost
- INCAL SST Backplanes
- Pass Marker allows driver to sample on one BIB for entire pattern length for effective monitoring
144 Drive Monitor
- 25Mhz with 16Meg depth
- VOH: 0.5V to 5.5V
- 4-point Clock Skew/ RZ formatting on all channels
- Four types of monitoring available on all channels
- Opt Module: 16 analog channels
System Configurations: Chambers
- Dual Stack 8 Slot (x2), 75ºC to 155ºC Multi Chamber
- HTOL 56 slot & 28 slot, 75ºC to 155ºC
- LTOL (PTC) 24 slot, -55ºC to 155ºC
System Configurations: Prescreen Bench Options
- Full Bench w/Fixture
- Compact Cube w/Fixture
Option Module Analog 1
- 16 independently configured channels
- 20V P-P output swing
- Frequency 10Hz to 20MHz
- Phase Shift 1 degree resolution
- DC offset within +/-10v output Rai

Inspire XP8160 Burn-in System Datasheet
(pdf. 560 KB)